eRing is a computer program for simulation, indexing and analysis of TEM ring (polycrystalline) diffraction patters. It has the same functionality as CSpot however limited to ring diffraction patterns.
Figure 1. eRing user interface
The program allows for manipulation of simulated diffraction patterns in real-time and in an interactive manner by changing and visualizing crystal orientation and adjusting simulation parameters (e.g., microscope operating conditions). It’s main feature is the ability to perform automatic indexing of integrated diffraction profiles (XRD-like) and their analysis. The program contains a build-in crystallographic calculator providing additional abilities in the analysis of diffraction patterns. The data produced by eRing can be saved in a form of bitmaps or reports (Word files).eRing is mainly dedicated to be a laboratory tool helping in the analysis and interpretation of data. It can be also used as a teaching aid.
The demo version of the software can be downloaded here
Figure 2. An example of TEM ring diffraction patterns: (a) experimental, (b) simulated, (c) superposition of experimental and simulated pattern and (d) indexed XRD-like profile created using experimental pattern